Filter
Top Products
Test Pattern File Formats FlexTest Test Pattern File Format
FastScan and FlexTest Reference Manual, V8.6_4
4-15
The scan chain definition defines the data associated with a scan chain in the
circuit. If there are multiple scan chains within one scan group, each scan chain
will have its own independent scan chain definition. The scan chain name will be
enclosed in double quotes. The scan-in pin will be the name of the primary input
scan-in pin enclosed in double quotes. The scan-out pin will be the name of the
primary output scan-out pin enclosed in double quotes. The length of the scan
chain will be the number of scan cells in the scan chain. Any scan chains listed in
the test pattern file must be defined with the Add Scan Chains command.
PROCEDURE <procedure_type> “scan_group_procedure_name” =
<list of events>
END;
The type of procedures in each scan group may include shift procedure, load and
unload procedure, shadow-control procedure, master-observe procedure, and
shadow-observe procedure. These procedures should be exactly the same as the
test procedure file. The list of events of each procedure may be any combination
of the following commands:
FORCE “primary_input_pin” <value> <time>;
This command is used to force a value (0,1, X, or Z) on a selected primary input
pin at a given time. The time values must not be lower than previous time values
for this command. The primary input pin will be enclosed in double quotes.
APPLY “scan_group_procedure_name” <#times> <time>;
This command indicates the selected procedure name is to be applied the selected
number of times beginning at the selected time. The scan group procedure name
will be enclosed in double quotes. This command may only be used with the load
and unload procedures.
FORCE_SCI “scan_chain_name” <time>;
This command indicates the time in the shift procedure that values are to be
placed on the scan chain inputs. The scan chain name will be enclosed in double
quotes.
MEASURE_SCO “scan_chain_name” <time>;