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[SENSe[<
chan
>]]:SWEep
The SENSe:SWEep commands select how many readings will be taken during a
measurement, and how many of the readings occur before (pre-arm) and after
(post-arm) the arm event.
Since the triggering and timebase circuits of the HP E1429 are shared between both
sensing channels, the settings for [SENSe[<chan>]]:SWEep are the same for both
values of chan (1 and 2). Setting SENSe1:SWEep values will also set
SENSe2:SWEep values and vice versa.
Memory Usage Measurements which specify multiple bursts (ARM:STARt:COUNt > 1) of both
pre-arm and post-arm readings (SENSe:SWEep:OFFSet:POINts ≤ -3 with
SENSe:SWEep:POINts > 9) cause memory to be partitioned into segments to hold
each burst of readings. The HP E1429 will automatically allocate
ARM:STARt:COUNt memory partitions large enough to hold the specified number
of pre-arm and post-arm readings. Since a large number of pre-arm readings may
occur before the arm event causes post-arm readings to be taken, each memory
partition is treated like a circular buffer where pre-arm readings may "wrap" or
overwrite each other multiple times before the arm event occurs and the burst of
readings completes with the post-arm readings being taken. After all post-arm
readings have been taken in a partition, if ARM:STARt:COUNt is not yet satisfied,
the instrument directs the next burst of readings into the next memory partition.
Note There is a time window of typically 630 µs where pre-arm readings will be lost
while the HP E1429 arranges for readings to be directed into the next memory
partition. If an ARM event (ARM:STARt:SOURce) or TRIGger event (sample)
occurs during this time window, it will be ignored with no error reported.
[SENSe[<
chan
>]]:SWEep Subsystem Command Reference 257