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Dual-Rate: The Pre-Count readings can be measured at one sample
rate; then the Post-Count readings can be measured at another sample rate.
The possible sample rate sources occur in pairs. There are four possible
pairs:
{ EXT1 BNC (pre), EXT2 BNC (post); or vice-versa }
{ ECLTRG0 (pre), ECLTRG1 (post); or vice-versa }
{ REFERENCE (pre), REFERENCE/N (post)}
{ REFERENCE/N (pre), REFERENCE (post)}
(N=2,4,10,20,40...4E8).
Timebase and Trigger
additional
supplemental
characteristics
Fixed error in sample
time (4.9.1)
40 psec (record size 32K)
Arm Subsystem Each event in this subsystem allows acquisition of one waveform record
(i.e., a burst of one or more dual-channel A/D conversions). (Note that in
SCPI, each A/D conversion event is a "Trigger".)
Sources: VXI Trigger Busses (TTL and ECL), External BNC, plus
input channel voltage (*). The logical "OR" condition of any two of these
sources may be used.
(*) Each channel’s detection circuitry uses two programmed voltage levels,
so that it is possible to generate the arm event when the signal either enters
or leaves a defined voltage window. Voltage level set points typically are
accurate to 3% of full-scale and have hysteresis 0.5% of full-scale.
Rate: when not taking Pre-[Arm]count readings: up to 2M/sec.
when taking Pre-[Arm]count readings: 650
µsec typical
Count: 1 to 65535 or continuous (no pre-arm readings)
1 to 128 (with pre-arm readings)
Delay: Specifies additional programmed time delay from an
arm’s causative event to when the arming actually occurs. This is in
addition to irreducible internal delays.
326 Specifications Appendix A