On-Wafer Measurements
Hewlett-Packard Company, “On-Wafer Measurements Using the HP 8510 Network Analyzer and
Cascade Microtech Wafer Probes,” Product Note 8510-6 HP publication number
5054-1570
Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, “Advancements in On-Wafer Probing
Calibration Techniques,
n
Hewlett-Packard RF and Microwave Measurement Symposium paper,
1991
Lautzenhiser, S., A. Davidson, D. Jones, “Improve Accuracy of On-Wafer Tests Via
LRM
Calibration,” Reprinting from “Microwaves and RF” HP publication number
5052-1286,
January
1990
“On-Wafer Calibration: Practical Considerations,
n
HP
8510/8720
News HP publication number
5001-6837,
February 1993
6-172
Application and Operation
Conoepts