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using HP-IB, 6-152
sequence of measurement, 2-3
sequencing
autostarting, 6-147
cascading multiple sequences, 2-76
changing the sequence title, 2-73
clearing a sequence from memory, 2-72
command information, 6-146
concepts, 6-146-152
decision making functions, 6-150
deleting commands, 2-71
editing, 6- 147
editing a sequence, 2-71
gosub
sequence command, 6-148
HP-GL commands, 6-151
inserting a command, 2-71
Iimit test sequence, 2-79
loading a sequence from disk, 2-75
loop counter sequence, 2-77
menu, 6-148
modifying a command, 2-72
printing a sequence, 2-75
purging a sequence from disk, 2-75
reading using HP-IB, 6-152
running a test sequence, 2-70
special functions menu, 6-150
stopping a sequencing, 2-70
storing a sequence on a disk, 2-74
subprograms, 2-76
test procedure, 2-68
titles, 6-147
‘ITL
input for decision making, 6-148
TI’L
I/O menu, 6-148
‘ITL
out menu, 6-150
with loop counter, 6-147
serial number plate location, 1-12
serial
(RS-232)
interface,
l-11
service and support options, 1-14
service request asserted by the
analyzer
(S),
11-20
service request (SRQ) control
line,
11-18
setting gate parameters, 2-85
setting HP-IB addresses, 1
l-2
1
setting measurement parameters using
markers, 2-26
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8,
6-46
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p,
6-46
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646
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g,
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6-46
9
x
of type-N
calil
xation
standard, 5-6
SHl
(full-source
handshake), 11-19
shape of gate, 2-85
shipment weight, 7-21
shortened sweep time, 5-50
signal flow in a mixer example, 3-33
single
bus concept, 11-20
single page of values printed or plotted, 4-30
single point
limits,
2-51
six gigahertz operation option, 1-13
sloping
limit
lines,
2-49
smith chart
format, 6-34
Smith chart markers, 2-25
G+jB MKR, 2-26
LIN MKR, 2-26
LOG
MKR,
2-26
Re/Im
MKR, 2-26
R+jX MKR, 2-26
Smith or polar format markers, 2-22
smoothing, 6-7, 6-52
Smo status notation,
l-9
softkey
label location, l-10
labels of display,
l-10
location,
l-4
softkey definitions, 9-2
softkey locations, 9-75
softkey
menu
hiding, 2-19
softkey
menu maps, 8-l
software
sample, 1
l-7
solutions
for printing or plotting problems, 4-32
solving
disk storage problems, 443
source, 6-2
source attenuator
switch protection, 6-20
source match, 6-59
uncorrected specifications, 7-3
span
frequency:decrea.se,
5-51
span setting for gating, 2-85
S-parameters, 6-29
specifications,
7-l
3.5~mm
test ports, 7-5
5OU
type-N test ports, 7-4
75Q
type-F test ports, 7-8
75G
type-N test ports, 7-6
7-mm
test port, 7-2
dynamic range,
7-l
error-corrected, 7-2
external source mode, 7-12
frequency characteristics, 7-10
frequency offset, 7-12