Filter
Top Products
hold mode, 6-20
interconnect location, 1-12
test set switch,
controlling
the, 5-54
test using
limits,
2-53
time domain
bandpass, 6-127
bandpass
mode, 6-125
bandpass
mode:reflection,
6-127
bandpass
mode: transmission,
6-
129
concepts, 6-125-145
forward transform mode, 6-126
gating, 6-141
gating procedure, 2-85
general theory, 6-126
low pass, 6-130
low pass impulse mode, 6-125
low pass mode,
fault
location
measurements, 6-131
low pass mode, reflection, 6-131
low pass mode, transmission, 6-133
low pass, setting frequency range, 6-130
low pass step mode, 6-125
masking, 6-135
measurements, 2-83
option, 1-13
range, 6-138
reflection response, 2-88
relative velocity factor, 6-127
resolution, 6-139
transform, 6-7
transmission response measurement, 2-83
velocity factor, 2-90
windowing, 6-136
time domain range
dehning,
6-12
time for measurements, 7-16
time stamp, 4-30, 11-14
time-to-frequency domain, 6-126
title
area of display,
l-9
of sequence, 2-73
the active channel display, 2-9
titling
the displayed measurement, 4-29
to use fast
2-port
calibration, 5-54
trace math, 2-8
divide measurement data by the memory
trace, 2-8
trace math operation, 6-6
trace noise
reducing, 5-57
trace viewing, 2-7
tracking, 6-60
an amplitude, 2-35
transfer formats, 7-17
transfer of data, 11-17
transform, 6-7
CW time-to-frequency domain, 6-142
frequency-to-time domain, 6-125
time-to-frequency domain, 6-126
transform measurements
forward, 6-143
transform menu, 6-125
transform modes
time domain bandpass, 6-125
time domain low pass
impulse,
6-125
time domain low pass step, 6-125
transistor test fixtures, 11-3
transmission measurements
using
bandpass
mode, 6-129
using low pass mode, 6-133
transmission response in time domain, 2-83
transmission tracking
uncorrected specifications, 7-3
trigger menu, 6-19
t&state
drivers
(E2),
11-19
TRL calibration, 2-91
TRL*
error-correction, 5-24
TRL
“ARM
*
calibration, 6-92
error model, 6-93
fabricating and defining standards, 6-98
how it works, 6-93
improving raw load match, 6-95
improving raw source match, 6-95
isolation, 6-94
load match, 6-95
options, 6-100
procedure, 6-97
reason for using, 6-92
requirements for standards, 6-97
source match, 6-95
terminology, 6-92
TRL*/LRM*
two-port calibration, 6-81
TRL standard modification, 5-29
TRM*
error-correction, 5-25
TRM standard modification, 5-31
trouble
solving for printing or plotting, 4-32
with disk storage, 4-43
tsH
annotation, 6-20
tsH
status notation,
l-9
T
(taIk
mode), 11-20
TTL
I/O, 6-148
tuned receiver mode, 3-17, 6-119
compatible sweep types, 2-66
description, 2-66
external source requirements, 2-67
making measurements, 2-66
mixer testing, 6-157
test setup, 2-66
Index-25