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example, 2-3
examples, 2-1
output results, 2-5
parameters set with markers, 2-26
sequence, 2-3
type:setting,
2-4
measurement accuracy
calibration standards, 5-6
changing parameters, 5-5
compensating for directional coupler
response, 5-36
connector repeatability, 5-2
error-correction, 5-4
frequency drift, 5-3
increasing, 5-2
interconnecting cables, 5-2
performance verification, 5-3
reference plane and port extensions, 5-3
temperature drift, 5-2
measurement averaging
changing, 5-56
measurement calibration
concepts, 6-57-109
measurement channel, how to view a single,
5-53
measurement errors
causes of, 6-58
correcting for, 6-78
crosstalk, 6-60
directivity, 6-58
frequency response, 6-60
isolation, 6-60
load match, 6-59
source match, 6-59
tracking, 6-60
measurement frequencies, diagram, 3-10
measurement points
how to reduce, 5-52
measurement port specifications, 7-2
uncorrected for errors, 7-3
measurement problems
electricaIIy
long devices, 5-48
measurement programs, 11-7
measurement results
saving, 4-36
measurements
conversion loss for mixers, 3-7
conversion loss using tuned receiver mode,
3-17
high dynamic range conversion loss for
mixers, 3-12
Lo
to RF isolation for mixers, 3-33
mixer,
3-l
mixer considerations, 3-2
mixer conversion compression, 3-28
mixer group delay or phase, 3-24
mixer isolation, 3-33
mixers tied IF, 3-17
non-coaxial, 2-91
optimized,
5-l
optimizing, 4-43
power meter calibration for, 3-6
RF feedthrough for mixers, 3-35
swept RF/IF mixers, 3-7
using swept
list
mode, 2-61
using the tuned receiver mode, 2-66
measurement setup diagram shown on
analyzer display, 3-31
measurement setup from display, 3-10
measurement times, 7-16
measurement title, 429
measurement uncertainties
3.5~mm
test ports, 7-5
5OQ
type-N, 7-4
75Q
type-F test ports, 7-8
75Q
type-N test ports, 7-6
7-mm
test ports, 7-2
measure restart, 1-12
memory
available, 12-2
battery backup, 12-2
CMOS, 12-2
conserving, 12-6
display, 6-7
external disk, 12-4
insufficient, 12-3
internal disk, 124
non-volatile, 12-2
requirements, 12-3
saving calibration data, 12-2
saving current instrument state, 12-1
saving instrument states, 12-2
types of, 12-1
volatile, 12-1
memory-intensive operations, 12-6
memory math functions, 6-48
memory register
contents, 4-33
memory trace, 2-7
memory trace arrays
memory requirements, 12-3
menu
calibrate, 6-80
al
kit, 6-82
HP-IB, 6-111
input ports, 6-31
limits, 6-114
power, 6-14
scale reference, 6-41
S-parameter, 6-30
Index-14