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High-performance Embedded Workshop 16. Using the Test Support Facility
REJ10J1837-0100 Rev.1.00 Nov. 16, 2008
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In some cases it is necessary to make detailed setting specific to each of the test items before saving test-image data. If
you double-click on a test item in the Create New Test Image dialog box, a further dialog box for detailed setting opens.
When a test item has any detailed setting, it is possible to customize test-image data of this test item before saving. On
the other hand, when a test item does not allow detailed setting and the checkbox for this test item is selected, all test-
image data of this item will be saved into the file.
A save file icon (
) in the "Saving into Test-Image File" column of an item listed in the View menu indicates that this
data can be saved into a test-image file.
16.6.1 Functions that can be saved into test-image files (common to all High-performance
Embedded Work
shop products)
Among the functions common to all High-performance Embedded Workshop products, test-image data of the test items
listed below can be saved into test-image files.
The following table shows the test items in the Create New Test Image dialog box and the corresponding windows from
which the data will be saved into test-image files.
For more information on the test-image data to be saved into test-image files, how to make detailed setting, and test
results, see the descriptions of test items for the corresponding windows.
Create New Test Image Dialog Box
Test Group Name Test Item Name
Window (Tab) Name Opened by
Build Output Window Build tab of the Output window Output
Debug Output Window Debug tab of the Output window
[View -> Output]
Register * Register [View -> CPU -> Registers]
IO * IO [View -> CPU -> IO]
Status * Status [View -> CPU -> Status]
CPU
Memory * Memory [View -> CPU -> Memory]
Code StackTrace * StackTrace [View -> Code -> Stack Trace]
Note:
*. Test items cannot be selected when the High-performance Embedded Workshop is not connected to any target.
16.6.1.1 Output-Build/Debug (Output window)
The following table shows information on the test-image data to be saved into test-image files and test results (not
matched).
Test group name Output
Test item name Build Output Window
Test-image data to be
saved into test-image files
All information in the Build tab of the output window.
Original Content of the test-image file
New Data in the current High-performance Embedded Workshop system or in another test-image
file to be compared with
Test result details
Example Original:
New:
Building - New - Debug
Test group name Output
Test item name Debug Output Window
Test-image data to be
saved into test-image files
All information in the Debug tab of the output window.
Test result details Original Content of the test-image file