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High-performance Embedded Workshop 16. Using the Test Support Facility
REJ10J1837-0100 Rev.1.00 Nov. 16, 2008
239
New Data in the current High-performance Embedded Workshop system or in another test-image
file to be compared with
Example Original:
Connected
New:
Step Normal End
No detailed setting specific to the test item can be made.
16.6.1.2 CPU-Register (Register window)
The following table shows information on the test-image data to be saved into test-image files and test results (not
matched).
Test group name CPU
Test item name Register
Test-image data to be
saved into test-image files
All information in the Register window.
Failed at register Name of the unmatched register
Src Content of the test-image file
Dest Data in the current High-performance Embedded Workshop system or in another test-
image file to be compared with
Test result details
Example Failed at register R11, Src = 0x00000000, Dest = 0x00000fff
No detailed setting specific to the test item can be made.
16.6.1.3 CPU-IO (IO window)
The following table shows information on the test-image data to be saved into test-image files and test results (not
matched).
Test group name CPU
Test item name IO
Test-image data to be
saved into test-image files
Values set as detailed information and the range of data in the IO window acquired with this setting. No
I/O register is specified by default.
Failed at Name of the unmatched I/O register
Src Content of the test-image file
Dest Data in the current High-performance Embedded Workshop system or in another test-image
file to be compared with
Test result details
Example Failed at IPRC, register value is different: Src = 0000, Dest = FFFF
To make detailed setting
If you double-click on a test item in the Create New Test Image dialog box, a further dialog box for detailed setting
opens.