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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-558DUPINT (Duplication Interface Circuit Pack)
10
Notes:
a. When running the Long Test Sequence on Duplication Interface circuit
pack A, the results of Test #273 may overwrite the results of Test #274.
b. Refer to “SHDW-CIR” (Common Shadow Circuit) for a description of this
test.
c. Refer to “SPE-SELEC” (SPE Select Switch) for a description of this test.
Duplication Interface Circuit Pack Background
Test Query (#271)
This test queries the Duplication Interface circuit pack for the results of its
background tests. The response indicates the results of the last time the
following background tests were run:
1. D = Destructive, ND = Non-destructive
Table 10-186. System Technician-Demanded Tests: DS1-BD
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND
1
Duplication Interface Circuit Pack Status Query Test (#315) X X ND
Duplication Interface Circuit Pack Sanity Circuit Test (#273)(a) X D
Duplication Interface Circuit Pack Sanity Maze Test (#277) X X ND
Duplication Interface Circuit Pack SPE A Loop Back Test (#275) X X ND
Duplication Interface Circuit Pack SPE B Loop Back Test (#276) X X ND
Duplication Interface Circuit Pack Administration Terminal Loop
Back Test (#274)(a)
XXND
Inter-Duplication Interface Circuit Pack Loop Back Test (#280) X X ND
Duplication Interface Circuit Pack Background Test Query Test
(#271)
XXND
Duplication Interface Circuit Pack Invalid Message Query Test
(#272)
XXND
Common Shadow Circuit M-BUS Time-out Query Test (#285)
(b)
XND
Common Shadow Circuit Loop Back Test (#283) (b) X X ND
Common Shadow Circuit Address Decoder Test (#284) (b) X X ND
SPE Select Switch Query Test (#278) (c) X ND
Continued on next page