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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-1120SHDW-CIR (Common Shadow Circuit)
10
Notes:
a. Refer to DUPINT (Duplication Interface Circuit Pack) Maintenance
documentation for description of this test.
b. Refer to SPE-SELEC (SPE Select Switch) Maintenance documentation for
description of this test.
Common Shadow Circuit Loop Back Test (#283)
This test allows maintenance to loop data through the common shadow circuit
and examine the results. The test is designed to test the shadow data and
shadow address portions of the common shadow circuit. The test is done entirely
on the Duplication Interface circuit pack.
The Common Shadow Circuit is put into Maintenance Mode before the test is run.
Maintenance software writes data into an address in the maintenance address
space. This data is routed through the common shadow circuit and put into the
FIFO bank of the common shadow circuit. Maintenance reads the contents of the
FIFO bank and compares them with the value written to the maintenance address
space. The test is repeated with another address in the maintenance address
space.
This test does not disable the common shadow circuit and can be run with no
disruption in service. The test must be executed from control carrier B to test the
Duplication Interface B Common Shadow Circuit and from control carrier A to test
the Duplication Interface A Common Shadow Circuit.
1. D = Destructive; ND = Nondestructive
Inter-Duplication Interface Circuit Pack Loop Back Test
(#280) (a)
XXND
Duplication Interface Circuit Pack Background Test
Query Test (#271)
XXND
Duplication Interface Circuit Pack Invalid Message
Query Test (#272) (a)
XXND
Common Shadow Circuit M-BUS Time-Out Query Test
(#285)
XND
Common Shadow Circuit Loop Back Test (#283) X X ND
Common Shadow Circuit Address Decoder Test (#284) X X ND
SPE Select Switch Query Test (#278) (b) X X ND
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND
1
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