Lucent Technologies lucent Server User Manual


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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-651EXT-DEV ADMIN? N (External Device Alarm)
10
f. Refer to RING-GEN (Analog Ring Generator) section for a description of
this test.
Notes:
a. Refer to DC-POWER (Single Carrier Cabinet Power) section for a
description of this test.
b. Refer to EMG-XFER (Emergency Transfer) section for a description of this
test.
c. Refer to RING-GEN (Analog Ring Generator) section for a description of
this test.
External Device Alarm Test (#120)
The External Device Alarm Test requests the state of the External Device Alarm
from the Maintenance circuit pack and reports the results. The test has no effect
on the external device itself.
1. D = Destructive; ND = Nondestructive
Single Carrier Cabinet Tests
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND
1
SCC Power Query Test (#79) (a) X X ND
Emergency Transfer Query Test (#124) (b) X X ND
External Device Alarm Test (MAJOR port) (#120) X X ND
External Device Alarm Test (MINOR port) (#120) X X ND
Analog Ring Generator Initialization Test (#117) (c) X X ND
Analog Ring Generator Query Test (#118) (c) X X ND
Table 10-219. TEST #120 External Device Alarm Test
Error
Code
Test
Result Description/ Recommendation
1000 ABORT System resources required to run this test are not available.
1. Retry the command at 1 minute intervals a maximum of 5 times.
2. If the test continues to abort, escalate the problem.
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