Lucent Technologies lucent Server User Manual


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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-917PDMODULE, TDMODULE (Data Module)
10
Information and Control Channel Local Loop
Test (#13)
This is a set of four tests that check the operation of the information and control
channels used between the SPE and the Digital Line port circuit.
NOTE:
This is an Internal Loop Around test only and does not check building
wiring. Use Test #175 for external loop around tests to the data module.
1. The SPE first sends a message to the on-board microprocessor to loop
around both the information and control channels for the port. Then, the
primary information channel loop back test is run. The test is performed by
sending a digital count from the Tone-Clock circuit pack on the primary
channel time slot and receiving the same digital count with a GPTD. The
digital count looks like transparent data to the on-board microprocessor.
2. With the port still in loop around mode, the S channel Loop Around Test is
performed next. This test consists of sending four different transparent
patterns to the on-board microprocessor, receiving them back, and
comparing them.
3. The third test is a Loop Around Test for the secondary (alternate) channel.
It is not performed for data modules since this channel is not used by
MPDMs, MTDMs, and stand-alone DA’s [G3iV2-386].
4. A Conference Test is done next for the primary channel. This test is the
same as the Analog Line Terminal/Port Conference Test (#6).
Only one value (Pass, Fail, or Abort) is generated as a result of four tests run. If
any test fails or aborts, the sequence is stopped.
Table 10-308. TEST #13 Information and Control Channel Local Loop Test
Error
Code
Test
Result Description/ Recommendation
ABORT Internal System Error.
1. Retry the command at one-minute intervals a maximum of five
times.
2. If the test continues to abort, escalate the problem.
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