Lucent Technologies lucent Server User Manual


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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-1164STBY-SPE (Standby SPE)
10
Test Sequence of Test SPE-Standby Command
Test
Number Name of Test and Associated MO
Short Test
Sequence
Long Test
Sequence
332 Memory Functional Test X
318 Shadow Link Test (SHDW-LNK) X
285 Common Shadow Circuit MBUS Time-out Query
(SHDW-CIR)
X
283 Common Shadow Circuit Loop Back Test (SHDW-CIR) X X
284 Common Shadow Circuit Address Decoder Test
(SHDW-CIR)
XX
278 SPE Select Switch Query (SPE-SELEC) X X
315 Duplication Interface Status Query (DUPINT) X X
275 Duplication Interface SPE A Loop Back Test (DUPINT) X X
276 Duplication Interface SPE B Loop Back Test (DUPINT) X X
280 Inter-Duplication Interface Loop Back Test (DUPINT) X X
271 Duplication Interface Background Test Query (DUPINT) X X
277 Duplication Interface Sanity Maze Test (DUPINT) X X
272 Duplication Interface Invalid Message Query (DUPINT) X X
274 Duplication Interface Manager I Loop Back Test
(DUPINT)
XX
273 Duplication Interface Sanity Circuit Test (DUPINT) X
85 Read All Memory Test X
86 RAM Checksum Test X
87 Memory Parity Test X
52 Control Channel Test (DATA-BD) X X
50 NPE Audit (DATA-BD) X
For each administered Network Control Data Channel in the Standby SPE, the following
DATA-CHL tests are run:
107 Data Channel Reset (DATA-CHL) X
108 Data Channel DPR Test (DATA-CHL) X
109 Data Channel Maintenance Loop Around Test
(DATA-CHL)
XX
110 Data Channel Crosstalk Test (DATA-CHL) X X
111 Data Channel Loop Back Test (DATA-CHL) X X
93 Switch Control Reset Test (SW-CTL) X
325 Destructive EPN Maintenance Board Interface Test
(SW-CTL)
X