Lucent Technologies lucent Server User Manual


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DEFINITY Enterprise Communications Server Release 6
Maintenance for R6vs/si
555-230-127
Issue 1
August 1997
Maintenance Object Repair Procedures
Page 10-235CARD-MEM (Memory Card)
10
Memory Card Translation Data Integrity Test
(#694)
This test, which is nondestructive, verifies the integrity of the translation file stored
in the memory card by reading (without any PREC updates) the translation file
from the memory card and by then performing a checksum error checking. The
calculated checksum value is compared with the recorded checksum value in
the translation file. If these two values are different, this indicates that the
translation file is corrupted.
2117 ABORT No translation file has been saved onto the memory card.
1. Enter the save translation command, and verify that the translations are
saved onto the memory card successfully.
2. Retry the command at 1-minute intervals a maximum of 5 times.
104 FAIL Directories on the memory card are corrupted and cannot be recovered.
105 FAIL "0" cannot be written into memory before an erase operation.
106 FAIL Memory card cannot be erased.
107 FAIL Data cannot be written onto a memory card after an erasure.
1. Replace the memory card and re-run the test.
108 FAIL 12 volt power supply for the Memory Card Erase/Write/Read Test can’t be
turned on. The 12 volt power supply on TN777B NETCON circuit pack may
be defective.
1. Re-enter the test card-mem command, and verify the result of Test 701
for the 12 Volt Power Supply.
2. If Test 701 fails, follow the Standard Repair Procedure to replace the
TN777B NETCON circuit pack with a new TN777B circuit pack.
3. Retry the command a 1-minute intervals a maximum of 5 times.
Table 10-80. TEST #693 Memory Card Erase/Write/Read Test — Continued
Error
Code
Test
Result Description/ Recommendation
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