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DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-612DUPINT (Duplication Interface Circuit Pack)
10
Notes:
a. When running the Long Test Sequence on Duplication Interface circuit
pack A, the results of Test #273 may overwrite the results of Test #274.
b. Refer to “SHDW-CIR” (Common Shadow Circuit) for a description of this
test.
c. Refer to “SPE-SELEC” (SPE Select Switch) for a description of this test.
Duplication Interface Circuit Pack Background
Test Query (#271)
This test queries the Duplication Interface circuit pack for the results of its
background tests. The response indicates the results of the last time the
following background tests were run:
■ ROM Checksum Test: This test verifies the correctness of the Duplication
Interface circuit pack firmware.
■ RAM Test: This tests verifies that the RAM on the Duplication Interface
circuit pack is functioning properly.
1. D = Destructive; ND = Nondestructive
Duplication Interface Circuit Pack Sanity Maze Test (#277) X X ND
Duplication Interface Circuit Pack SPE A Loop Back Test
(#275)
XXND
Duplication Interface Circuit Pack SPE B Loop Back Test
(#276)
XXND
Duplication Interface Circuit Pack Administration Terminal
Loop Back Test (#274)(a)
XXND
Inter-Duplication Interface Circuit Pack Loop Back Test (#280) X X ND
Duplication Interface Circuit Pack Background Test Query
Test (#271)
XXND
Duplication Interface Circuit Pack Invalid Message Query Test
(#272)
XXND
Common Shadow Circuit M-BUS Time-out Query Test (#285)
(b)
XND
Common Shadow Circuit Loop Back Test (#283) (b) X X ND
Common Shadow Circuit Address Decoder Test (#284) (b) X X ND
SPE Select Switch Query Test (#278) (c) X ND
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND
1