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DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-1167PR-MEM (TN790 RISC Memory)
10
c. Aux Data of 100 is an LMM Flash Checksum initialization failure.
d. There are Functional Memory Test errors against the Processor circuit
pack. This test is run only on the Standby SPE in a High or Critical
Reliability system. On other systems or on the Active SPE, the test is run
only via a reset system 4 command or a reset system 5 command.
System Technician-Demanded Tests:
Descriptions and Error Codes
Always investigate errors in the order in which they are presented in the table that
follows when you are inspecting errors in the system. By clearing error codes
associated with the
Read All Memory Test,
for example, you may also clear
errors generated from other tests in the testing sequence.
1. D = Destructive; ND = Nondestructive
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND
1
Processor Cache Test (#895)(a) X ND
Processor Cache Audit (#896)(a) X X ND
Processor Bus Time-out Exception Test (#82)(a) X X ND
Processor BOOTPROM Checksum Test (#897)(a) X X ND
Processor Write Buffer Test (#900)(a) X X ND
Memory Burst Read Test (#908) X X ND
Read All Memory Test (#85) X ND
Memory Parity Error Detection Test (#87) X X ND
Flash Memory Checksum Test (#86) X ND
Memory Functional Test (#332) (b) X D
MTP Outpulse Relay Test (#102) (c) X X ND
MTP External Modem Present Test (#230) (c) X X ND
MTP Analog Loop Around Test (#103) (c) X X ND
MTP Sanity Handshake Test (#106) (c) X X ND
MTP SAT Loop Around Test (#228) (c) X X ND
MTP Aux Loop Around Test (#229) (c) X X ND
MTP Reset Test (#101) (c) X D
MTP Dual Port Ram Test (#104) (c) X D
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